Scanning Tunneling Microscope
RHK-VG UHV-Scanning Tunneling Microscope
The instrument is a UHV STM/AFM instrument, RHK microscope, with UHV sample preparation and LEED/AES surface analysis facility. The microscope enables the determination of surface morphology and structure, including electronic structures of solid materials at atomic resolution at room temperature. The LEED/AES sample analysis will yield surface order parameters and elemental surface ratios with contaminants identified to ca. 3 %.
Samples must be single crystal and may be prepared by in situ Ar+ ion cleaning and annealing or may be cleaved in situ to prepare a fresh clean surface. Facilities for gas dosing to assess sample reactivity are present on the microscope.
Location: Room B13, Williamson Building | Member of staff: Dr Paul Wincott